We report the local measurements of the magnetic penetration depth λ in a superconducting Nb film using magnetic force microscopy (MFM). We developed a method for quantitative extraction of the penetration depth from single-parameter simultaneous fits to the lateral and height profiles of the MFM signal, and demonstrate that the obtained value is in excellent agreement with that obtained from the bulk magnetization measurements. © 2009 American Institute of Physics.
Publication Source (Journal or Book title)
Applied Physics Letters
Nazaretski, E., Thibodaux, J., Vekhter, I., Civale, L., Thompson, J., & Movshovich, R. (2009). Direct measurements of the penetration depth in a superconducting film using magnetic force microscopy. Applied Physics Letters, 95 (26) https://doi.org/10.1063/1.3276563