Sulphur precipitation in annealed sulphur-doped nickel studied by fluorescent X-ray emission
Document Type
Article
Publication Date
1-1-1998
Abstract
The results of measurements of S L2,3 ultra-soft X-ray emission spectra excited by synchrotron radiation at hv=163-165 eV for samples with 240 ppm S in Ni after annealing at 400-700°C are presented. It is found that S L2,3 X-ray emission spectra of S-impurity atoms in Ni show fine structure which can be simulated by a superposition of spectra of nickel sulphide and pure sulphur providing evidence that sulphur atoms are present after annealing both in solid solution and in clusters where they form S-S bonds. The variation of temperature and time of annealing (at T=400°C for 1 h and at T=700°C for 2 h) leads to some redistribution of intensity of S L2,3 X-ray emission valence spectra which can be attributed to changes in the number of S-Ni and S-S bonds in accordance with the limit of sulphur solubility at these temperatures.
Publication Source (Journal or Book title)
Materials Transactions, JIM
First Page
570
Last Page
573
Recommended Citation
Kurmaev, E., Stadler, S., Ederer, D., Yarmoshenko, Y., Zatsepin, D., Neumann, M., Callcott, T., Grush, M., Perera, R., Danilov, S., & Arbuzov, V. (1998). Sulphur precipitation in annealed sulphur-doped nickel studied by fluorescent X-ray emission. Materials Transactions, JIM, 39 (5), 570-573. https://doi.org/10.2320/matertrans1989.39.570