Title

Using circularly polarized soft x rays to probe antiferromagnetically correlated Co/Cu multilayers

Document Type

Conference Proceeding

Publication Date

6-1-2004

Abstract

The antiferromagnetic correlation between weakly coupled Co layers in Co/ Cu multilayers was investigated. The soft x-ray resonant magnetic scattering (SXRMS) technique was used for the study. For standard specular θ-2θ scans, half order peaks were observed with the energy of the incident x rays turned to the Co absorption edge. Rocking scans were derived at integer-order, half-integer-order and off-order, between 3/2 and second-order diffuse spectrum.

Publication Source (Journal or Book title)

Journal of Applied Physics

First Page

6672

Last Page

6674

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