Using circularly polarized soft x rays to probe antiferromagnetically correlated Co/Cu multilayers
Document Type
Conference Proceeding
Publication Date
6-1-2004
Abstract
The antiferromagnetic correlation between weakly coupled Co layers in Co/ Cu multilayers was investigated. The soft x-ray resonant magnetic scattering (SXRMS) technique was used for the study. For standard specular θ-2θ scans, half order peaks were observed with the energy of the incident x rays turned to the Co absorption edge. Rocking scans were derived at integer-order, half-integer-order and off-order, between 3/2 and second-order diffuse spectrum.
Publication Source (Journal or Book title)
Journal of Applied Physics
First Page
6672
Last Page
6674
Recommended Citation
Stadler, S., Idzerda, Y., Dvorak, J., & Borchers, J. (2004). Using circularly polarized soft x rays to probe antiferromagnetically correlated Co/Cu multilayers. Journal of Applied Physics, 95 (11 II), 6672-6674. https://doi.org/10.1063/1.1669311