Direct imaging of the two-dimensional Fermi contour: Fourier-transform STM

Authors

L. Petersen, Oak Ridge National Laboratory
P. Sprunger, Oak Ridge National Laboratory
Ph Hofmann, Oak Ridge National Laboratory
E. Lægsgaard, Oak Ridge National Laboratory
B. Briner, Oak Ridge National Laboratory
M. Doering, Oak Ridge National Laboratory
H. Rust, Oak Ridge National Laboratory
A. Bradshaw, Oak Ridge National Laboratory
F. Besenbacher, Oak Ridge National Laboratory
E. Plummer, Oak Ridge National Laboratory

Document Type

Article

Publication Date

1-1-1998

Abstract

Direct images of the two-dimensional Fermi contour at a surface can be generated by a Fourier transform (FT) of scanning tunneling microscopy (STM) images taken at low-bias voltages. The origins of the Fermi contour in the FT are the standing waves of electrons near the Fermi energy caused by defects in the surface. Several examples of FT-STM are presented to illustrate the simplicity of this technique. The advantages and limitations of this Fermi contour imaging technique are discussed. © 1998 The American Physical Society.

Publication Source (Journal or Book title)

Physical Review B - Condensed Matter and Materials Physics

First Page

R6858

Last Page

R6861

Recommended Citation

Petersen, L., Sprunger, P., Hofmann, P., Lægsgaard, E., Briner, B., Doering, M., Rust, H., Bradshaw, A., Besenbacher, F., & Plummer, E. (1998). Direct imaging of the two-dimensional Fermi contour: Fourier-transform STM. Physical Review B - Condensed Matter and Materials Physics, 57 (12), R6858-R6861. https://doi.org/10.1103/PhysRevB.57.R6858