Ultrafast optics used to study carrier dynamics of high quality silicon on glass sample

Authors

O. S. Magaña-Loaiza, Instituto Nacional de Astrofisica Optica y Electronica
R. Sobolewski, University of Rochester
J. J. Sanchez Mondragon, Instituto Nacional de Astrofisica Optica y Electronica
C. Kosik-Williams, Corning Incorporated
J. Zhang, University of Rochester

Document Type

Conference Proceeding

Publication Date

1-1-2010

Abstract

We present experimental and theoretical studies that regards in the formulation of a reflectance model that allows relating it with carrier dynamics in high quality silicon on glass sample as well as optical parameters. © 2010 Optical Society of America.

Publication Source (Journal or Book title)

Optics InfoBase Conference Papers

Recommended Citation

Magaña-Loaiza, O., Sobolewski, R., Sanchez Mondragon, J., Kosik-Williams, C., & Zhang, J. (2010). Ultrafast optics used to study carrier dynamics of high quality silicon on glass sample. Optics InfoBase Conference Papers https://doi.org/10.1364/fio.2010.jwa52