Title

Experimental ultrafast spectroscopy used to study carrier dynamics of high quality silicon on glass sample

Document Type

Conference Proceeding

Publication Date

1-1-2010

Abstract

We study, experimentally and theoretically, the carrier dynamics in high quality silicon on glass sample by a model that relates the reflectance time dependence with the carrier dynamics. © 2010 Optical Society of America.

Publication Source (Journal or Book title)

Optics InfoBase Conference Papers

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