Identifier
etd-1031103-133101
Degree
Master of Science in Electrical Engineering (MSEE)
Department
Electrical and Computer Engineering
Document Type
Thesis
Abstract
This work presents an effective built-in current sensor (BICS), which has a very small impact on the performance of the circuit under test (CUT). The proposed BICS works in two-modes the normal mode and the test mode. In the normal mode the BICS is isolated from the CUT due to which there is no performance degradation of the CUT. In the testing mode, our BICS detects the abnormal current caused by permanent manufacturing defects. Further more our BICS can also distinguish the type of defect induced (Gate-source short, source-drain short and drain-gate short). Our BICS requires neither an external voltage source nor current source. Hence the BICS requires less area and is more efficient than the conventional current sensors. The circuit under test is a 10-bit digital to analog converter using charge-scaling architecture.
Date
2003
Document Availability at the Time of Submission
Release the entire work immediately for access worldwide.
Recommended Citation
Aluri, Srinivas Rao, "Iddq testing of a CMOS 10-bit charge scaling digital-to-analog converter" (2003). LSU Master's Theses. 3314.
https://repository.lsu.edu/gradschool_theses/3314
Committee Chair
Ashok Srivastava
DOI
10.31390/gradschool_theses.3314