Development of grating-based x-ray Talbot interferometry at the advanced photon source
We report on the ongoing effort to develop hard x-ray Talbot interferometry at the Advanced Photon Source (APS), Argonne National Laboratory, USA. We describe the design of the interferometer and preliminary results obtained at 25 keV using a feather and a phantom sample lithographically fabricated of gold. We mention the future developmental goals and applications of this technique as a metrology tool for x-ray optics and beam wavefront characterization. © 2012 American Institute of Physics.
Publication Source (Journal or Book title)
AIP Conference Proceedings
Marathe, S., Xiao, X., Wojcik, M., Divan, R., Butler, L., Ham, K., Fezzaa, K., Erdmann, M., Wen, H., Lee, W., Macrander, A., De Carlo, F., Mancini, D., & Assoufid, L. (2012). Development of grating-based x-ray Talbot interferometry at the advanced photon source. AIP Conference Proceedings, 1466, 249-254. https://doi.org/10.1063/1.4742300