X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer
The first detailed x-ray study of static undulations in a liquid-crystal polymer is presented. By examining the nonspecular diffuse scattering from a 30-layer ferroelectric liquid-crystal polymer film, it is shown that the layer fluctuations are induced by the roughness of the film-substrate interface. This contrasts with the case of free-standing films wherein .thermal fluctuations play the major role. © 1993 The American Physical Society.
Publication Source (Journal or Book title)
Physical Review Letters
Geer, R., Shashidhar, R., Thibodeaux, A., & Duran, R. (1993). X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer. Physical Review Letters, 71 (9), 1391-1394. https://doi.org/10.1103/PhysRevLett.71.1391