Structural characterization of metal phosphonate langmuir-blodgett films by grazing incidence x-ray diffraction
The structural characterization of the inorganic lattices in a series metal phosphonate containing Langmuir-Blodgett (LB) films was reported using the grazing incidence X-ray diffraction (GIXD). The inorganic lattices increases the stability of the LB films and also introduces the solid state properties such as magnetism into these thin film materials. The GIXD pattern for the lanthanum octadecylphosphonate LB film was compared to the diffraction pattern obtained for the powdered sample of lanthanum butylphosphanate.
Publication Source (Journal or Book title)
Culp, J., Davidson, M., Duran, R., & Talham, D. (2002). Structural characterization of metal phosphonate langmuir-blodgett films by grazing incidence x-ray diffraction. Langmuir, 18 (21), 8260-8262. https://doi.org/10.1021/la026046i