Identifier

etd-05272004-162258

Degree

Master of Science (MS)

Department

Electrical and Computer Engineering

Document Type

Thesis

Abstract

This work presents IDDQ testing of a CMOS first order sigma-delta modulator of an 8-bit oversampling analog-to-digital converter using a built-in current sensor [BICS]. Gate-drain, source-drain, gate-source and gate-substrate bridging faults are injected using fault injection transistors. All the four faults cause varying fault currents and are successfully detected by the BICS at a good operation speed. The BICS have a negligible impact on the performance of the modulator and an external pin is provided to completely cut-off the BICS from the modulator. The modulator was designed and fabricated in 1.5 μm n-well CMOS process. The decimator was designed on Altera's FLEXE20K board using Verilog. The modulator and decimator were assembled together to form a sigma-delta ADC.

Date

2004

Document Availability at the Time of Submission

Release the entire work immediately for access worldwide.

Committee Chair

Ashok Srivastava

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