Identifier

etd-05272004-164455

Degree

Master of Science (MS)

Department

Electrical and Computer Engineering

Document Type

Thesis

Abstract

This work presents a case study, which attempts to improve the fault diagnosis and testability of the oscillation testing methodology applied to a typical two-stage CMOS operational amplifier. The proposed test method takes the advantage of good fault coverage through the use of a simple oscillation based test technique, which needs no test signal generation and combines it with quiescent supply current (IDDQ) testing to provide a fault confirmation. A built in current sensor (BICS), which introduces insignificant performance degradation of the circuit-under-test (CUT), has been utilized to monitor the power supply quiescent current changes in the CUT. The testability has also been enhanced in the testing procedure using a simple fault-injection technique. The approach is attractive for its simplicity, robustness and capability of built-in-self test (BIST) implementation. It can also be generalized to the oscillation based test structures of other CMOS analog and mixed-signal integrated circuits. The practical results and simulations confirm the functionality of the proposed test method.

Date

2004

Document Availability at the Time of Submission

Release the entire work immediately for access worldwide.

Committee Chair

Ashok Srivastava

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